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  1. Silicon Wafers with Oxide Coating

    Silicon Wafers available with thin film coatings .
    silicon2
    silicon wafer1
    wafer inspection1
    semiconductor wafer1
    uv measurement1
    semiconductor inspection1
    wafer carrier1
    wafer holder1
    inspection semiconductor1

    www.universityoxide.com - 2009-02-09

  2. Pyrex Wafers

    Pyrex Wafers available with thin film coatings .
    silicon2
    Pyrex1
    silicon wafer1
    wafer inspection1
    semiconductor wafer1
    uv measurement1
    semiconductor inspection1
    wafer carrier1
    wafer holder1
    inspection semiconductor1

    www.universitypyrex.com - 2009-02-10

  3. Gallium Arsenide Wafers

    Silicon Wafers available with thin film coatings at and below 1 micron thick.
    silicon2
    thin film1
    silicon wafer1
    Gallium Arsenide1
    wafer inspection1
    semiconductor wafer1
    uv measurement1
    semiconductor inspection1
    wafer carrier1
    wafer holder1
    inspection semiconductor1
    Gallium Arsenide Waferrs0

    www.universitygaas.com - 2009-02-09

  4. Quartz Wafers

    Quartz Wafers available with thin film coatings .
    Quartz2
    silicon2
    silicon wafer1
    wafer inspection1
    semiconductor wafer1
    uv measurement1
    semiconductor inspection1
    wafer carrier1
    wafer holder1
    inspection semiconductor1

    www.universityquartz.com - 2009-02-09

  5. The Krell-A real time image enhancement video processing system for OEMs including X-ray, Micro focus, microscopes, ultrasound or virtually any imaging device.

    The Krell-A real time image enhancement video processing system for OEMs including X-ray, Micro focus, microscopes, ultrasound or virtually any imaging device.
    video7
    digital5
    camera3
    machine3
    vision3
    integration3
    IMAGING2
    frame2
    analog2
    Hitachi2
    Kodak2
    power supply2
    ccd2
    MICROSCOPY1
    IMAGE ANALYSIS1
    grabber1
    VIDEO PROCESSING1
    WAFER INSPECTION1
    Optimas1
    Pulnix1
    Dalsa1
    SEMICONDUCTOR INSPECTION1
    Bitflow1
    CDROM INSPECTION0

    www.setiscience.com - 2009-02-12

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